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Evaluation of Dislocation Densities in Various Microstructures of Additively Manufactured Ti6Al4V (Eli) by the Method of X-ray Diffraction

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dc.contributor.author Muiruri, Amos
dc.contributor.author Maringa, Maina
dc.contributor.author Du Preez, Willie
dc.date.accessioned 2023-04-20T11:19:40Z
dc.date.available 2023-04-20T11:19:40Z
dc.date.issued 2020-11-26
dc.identifier.other doi:10.3390/ma13235355
dc.identifier.uri http://hdl.handle.net/11462/2446
dc.description Article en_US
dc.description.abstract Dislocations play a central role in determining strength and flow properties of metals and alloys. Di usionless phase transformation of ! in Ti6Al4V during the Direct Metal Laser Sintering (DMLS) process produces martensitic microstructures with high dislocation densities. However, heat treatment, such as stress relieving and annealing, can be applied to reduce the volume of these dislocations. In the present study, an analysis of the X-ray di raction (XRD) profiles of the non-heat-treated and heat-treated microstructures of DMLS Ti6Al4V(ELI) was carried out to determine the level of defects in these microstructures. The modified Williamson–Hall and modified Warren–Averbach methods of analysis were used to evaluate the dislocation densities in these microstructures. The results obtained showed a 73% reduction of dislocation density in DMLS Ti6Al4V(ELI) upon stress relieving heat treatment. The density of dislocations further declined in microstructures that were annealed at elevated temperatures, with the microstructures that were heat-treated just below the ! recording the lowest dislocation densities. en_US
dc.language.iso en en_US
dc.publisher Materials 2020, 13, 5355 en_US
dc.relation.ispartofseries Materials;2020, 13, 5355
dc.subject Directmetal laser sintering en_US
dc.subject Ti6Al4V(ELI) en_US
dc.subject Microstructure en_US
dc.subject X-ray diffraction en_US
dc.subject Dislocation density en_US
dc.title Evaluation of Dislocation Densities in Various Microstructures of Additively Manufactured Ti6Al4V (Eli) by the Method of X-ray Diffraction en_US
dc.type Article en_US


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